4g Test Card

Product Detail

Quick Details
Place of Origin:Guangdong, China (Mainland)
Brand Name:Grcard
Model Number:GSM Test SIM Card
Product Type:Sim Cards
Color:white
For:Cellphone or mobile phone
Packaging & Delivery

Delivery Detail:	1-7 days

LTE USIM Test Card TD-LTE Test Card Color Test Card
Byron Han
Tel: +86 18002561765
Skype:crystalhuanglian
Wechat:+8615817372512
whatsapp: +8615817372512
Alibaba ID: cn1511045478
*Chip Parameters
Grcard 2.5G Test IC card chip prouduts are high performance IC used in smartcard. In the chip there are 8 bit micro processor 48K byte program memorizer(MASK ROM),256 byte internal RAM (SRAM)
1K byte outside RAM(SRAM),32K byte data memorizer (EEPROM),and the Card Body Material is ABS or PVC.
*Main character of chip
CPU:8 bit CPU
*Memorizer (32K)
-256 byte inner RAM (256 x 8 bit SRAM)
-1K byte outer RAM (1024 x 8 bit SRAM)
-48K byte Program Memorizer (48Kx 8 bit ROM)
-32K byte Data Memorizer (32K x 8 bit EEPROM)
*EEPROM (32K)
-32KEEPROM as Data Memorizer
-single byte read ,write, and wipe
-multi bytes storage(1byte to1page)
-program clock come from vibrate clock that generated by chip itself
-At the normal temperature, can proceed at least 100,000 times erase and write operations.
-EEPROM data endurance more than ten years
-EEPROM program voltage generated in the chip
*Serial I/O interface
Match ISO/IEC-7816
asynchronous half duplex transmission protocol
Two kinds of transmission velocity(372/1 and 512/8)optional
*Randomizer
8- bit randomizer
*Power on reset
internal power on reset mechanism
*Low power work mode
SLEEP mode
CLOCK STOP mode
*Safety mechanism
Abnormal voltage/frequency detection function, DPA/SPS attacking immunity
*Work temperature
-25 c to +70 c
*Work voltage
2.7V to 3.3V,4.5V to 5.5V
*Work frequency
1 - 5 MHz (3.57MHz)
*Test SIM Card Specification:
Grcard 2.5G Test SIM Card Can use in The Agilent 8960 and others.to test set when running any GSM  test or lab application.
*The SIM has several benefits:
-UMTS security variables within the SIM match the default settings of the GSM test and lab applications
-Setup time is reduced because the SIM is configured with the same default IMSI and PLMN values broadcast from the test set
-For dual-mode testing, GSM speech loopback is supported for GSM Bit Error Ratio (BER) measurements